MicroLine

ML4710DD

This version of the ML4710 uses a back-illuminated sensor on deep depletion silicon for enhanced near infrared sensitivity. Deep depletion silicon has substantially higher dark current than standard silicon.

Sensor
sensor
e2v CCD47-10-1-109
size (mm)
18.8 mm
Resolution
Resolution
1024 x 1024
Pixel Size
13 um
bit depth
16-bit
Full Well
100ke-
read noise
11e-
dark current
12 eps @ -35C
shutter
Mechanical
peak q.e.
94%
interface
USB 2
frame rate
data rate
700 kHz
Available OpTions
Sensor Grade Selection
Liquid Cooling Adapters
Anti-Dew Technology
Camera Window Type

Quantum Efficiency

Quantum efficiency (QE) measures how effectively a detector converts incoming photons into electrons. In our graphs, QE is expressed as a percentage. A sensor’s QE typically varies based on its architecture, coatings, and materials. High QE remains a crucial consideration for applications such as astronomy, space debris imaging, and life science research.

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